Quality & Inspection

We’re here to help with all your inspection needs, whether you struggle with inspection capacity, or need extra capability, we can meet your requirements and alleviate the pressure. Our team has many years of experience in measurements and using CMMs and Optical Systems, We can supply on inspection reports as required

Please see our inspection equipment list for more information

Optical

CMM

measurements

Testing / Inspection Equipment
QUALITY APPROVALS

Testing / Inspection Equipment

Carl Zeiss Spectrum CMM

RDS C5 Probe system
Full feature graphic measurement
Accuracy up to (1.8 + L/300) μm
Calypso 2016 measurement software

Carl Zeiss O INSPECT

Scanning probe
Optical camera system
Full feature graphic measurement
Accuracy up to (1.8 + L/300) μm
Calypso 2018 measurement software

OPTOMECH VPP-3020 CNC x 2

Full Inspection reports
Advanced SPC software
Auto focus Lens & Control of Len’s lighting
Measurement of depths
Measuring accuracy (3+L/100) Microns
SPC report generator and monitoring

CARL ZEISS SURFCOM FLEX 50A

Instant Surface finish measurement
Skid less and the highest straightness accuracy
Precise & accurate
Measurement target 0 – 200MM
Sits on anti Vibration table

TRIMOS V3 Height gauge x 2

Measuring ranges 400 and 700 mm
Electronically adjustable measuring force
USB Interface
Complete probe kit

Keyence IM 7020

Automatic recognition of part position and orientation
Fast measurement (multiple parts simultaneously in seconds)
Wide range of applications and GD&T tools
Versatile programming for in-process and final inspections
Accurate and repeatable measurements
Ability to record results and create inspection report
Depth probe

Surfcom Nex – Contour Tracer

Best-in-class residual noise (Rz 0) thanks to a low-vibration linear drive
Resolution of up to 0.1 nm at a 6.4 µm range and 20 nm at a 1,000 µm range
With the optional tracing driver tilting unit it is possible to manually tilt the tracing driver +/-5 degrees

ZEISS CONTURA G2 RDS

scanning of features in all angular positions with VAST XXT on the flexible ZEISS RDS articulating probe

More…

Mitutoyo Laser Scan micrometer

Non-contact laser-based measuring system, mainly for outside diameter measurement.
Accuracy of ±0.5μm in the ø0.1 – ø25mm range can be achieved. It is highly suitable suited for pin gage measurement.
Ultra-high repeatability of ±0.05μm.